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John Jarvis, Ph.D. is a principal at Johdan Applied Technologies and serves as the president of the organization. John has over twenty five years of experience in both the chemical industry and the process instrumentation industry. He has considerable experience designing and fielding process instrumentation with considerable experience in UV, infrared, near infrared, Raman spectroscopies. During his tenure as a research scientist at Celanese, he was involved in development of analytical measurement methodologies. During his tenure as a principal scientist at Rosemount, he was responsible for developing UV and IR based electro-optic tunable etalon instruments for trace gas analysis in the UV and IR. He also developed AOTF-based NIR and laser Raman process instruments for multicomponent liquids analysis. He most recently led Detector Electronics’ gas detection division where he developed many of the present commercial offerings for point and line-of-site combustible gas and toxic gas detection. John holds B.Sc. and M.Sc. degrees in Chemistry from Pittsburg State University and a Ph.D. in Analytical Chemistry from Kansas State University. He is an inventor on three United States patents relating to process instrumentation. John can be reached at jarvis@johdan.com |
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